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J. C. Li, H. Wang, X. Z. Du, Z. Luo, Y. C. Wang, W. P. Bai, X. S. Su, S. C. Shen, Y. W. Yin, X. G. Li, High endurance (>1012) via optimized polarization switching ratio for Hf0.5Zr0.5O2-based FeRAM, Appl. Phys. Lett., 2023, 122, 082901.
Z. W. Bao, S. Ding, Z. Z. Dai, Y. W. Wang, J. H. Jia, S. C. Shen, Y. W. Yin, X. G. Li, Significantly enhanced high-temperature capacitive energy storage in cyclic olefin copolymer dielectric films via ultraviolet irradiation, Mater. Horiz., 2023. S. Ding, Z. W. Bao, Y. W. Wang, Z. Z. Dai, J. H. Jia, S. C. Shen, Y. W. Yin, X. G. Li, Excellent high-temperature dielectric energy storage of flexible all-organic polyetherimide/poly(arylene ether urea) polymer blend films, J. Power Sources., 2023, 570, 233053. Z. Luo, X. Z. Du, H. Gan, Y. Lin, W. S. Yan, S. C. Shen, Y. W. Yin, X. G. Li, 5.1 Å EOT and low leakage TiN/Al2O3/Hf0.5Zr0.5O2/Al2O3/TiN heterostructure for DRAM capacitor, Appl. Phys. Lett., 2023, 122(19). H. Gan, S. C. Shen, Y. X. Li, Y. W. Yin, X. G. Li, Performance manipulation of ferroelectric tunnel junctions via oxygen vacancies in barrier, Acta Mater., 2023, 119101.
X. Zhou, H. Y. Sun, J. C. Li, Y. Lin, X. Z. Du, H. Wang, Z. Luo, Z. J. Wang, Y. Lin, S. C. Shen, Y. W. Yin, X. G. Li, A flexible Hf0.5Zr0.5O2 thin film with highly robust ferroelectricity, J. Materiomics., 2023.
X. Z. Du, L. Zhen, S. C. Shen, W. P. Bai, H. Gan, Y. W. Yin, X. G. Li, High-κ Hf0.3Zr0.7O2 Film with Morphotropic Phase Boundary for DRAM Capacitor by Controlling H2O Dose, Appl. Surf. Sci., 2023, 158078. Y. C. Wang, S. Liu, Z. Luo, H. Gan, H. Wang, J. C. Li, X. Z. Du, H. Y. Zhao, S. C. Shen, Y. W. Yin, X. G. Li, Ultralow Subthreshold Swing of a MOSFET Caused by Ferroelectric Polarization Reversal of Hf0.5Zr0.5O2 Thin Films, ACS Appl. Mater. Interfaces., 2023, 15(36): 42764-42773.
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